Development and application of a new type cesium surface ionization ion source for SIMS.
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of the Mass Spectrometry Society of Japan
سال: 1986
ISSN: 1340-8097,1880-4225
DOI: 10.5702/massspec.34.13